Advanced Semiconductor Technology Laboratory
Characterization for GaN-based devices
jhlim@g.hongik.ac.kr
jhgjhg5@g.hongik.ac.kr
gastich666@naver.com
fuddms021120@naver.com
yjo5320@naver.com
gksalsrnr42@naver.com
ehdtjgh@naver.com
jh041699@naver.com
cs_y0849@naver.com
Characterization for Vertical GaN(GaN-on-GaN) Devices
kanoi99@naver.com
Characterization for p-Channel GaN Devices
s_soo96@naver.com
Fabrication for High-Al% AlGaN HFET
dkrdj055@naver.com
Characterization for GaN-based FinFET Devices
wonchul0310@naver.com
zeamp2@gmail.com