International journal 12 페이지 | ASTL

Publication

Advanced Semiconductor Technology Laboratory

International journal

2004

7

Analytical cascode model of buried-gate SiC MESFETs Ho-Young Cha, Y. C. Choi, L. F. Eastman, and M. G. Spencer Electronics Letters, vol. 40 (4), pp.271-273, 2004. DOI : 10.1049/el:20040169, ISSN : 0013-5194 (Print), 1350-911X (Online)

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6

Effects of a molecular beam epitaxy grown AlN passivation layer on AlGaN/GaN heterojunction field effect transistors J. Hwang, W. J. Schaff, B. M. Green, H. Kim, Ho-Young Cha, and L. F. Eastman Solid-State Electronics, vol 48, pp. 363-366, 2004. DOI : 10.1016/S0038-1101(03)00324-1, ISSN : 0038-1101

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2003

5

Gate field emission induced breakdown in power SiC MESFETs Ho-Young Cha, C. I. Thomas, L. F. Eastman, and M. G. Spencer IEEE Electron Device Letters, vol. 24, no. 9, pp571-573, 2003. DOI : 10.1109/LED.2003.815422, ISSN : 0741-3106 (Print), 1558-0563 (Online)

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4

Reduced trapping effects and improved electrical performance in buried gate 4H-SiC MESFETs Ho-Young Cha, C. I. Thomas, G. Koley, L. F. Eastman, and M. G. Spencer IEEE Transactions on Electron Devices, vol. 50, no. 7, pp1569-1574, 2003. DOI : 10.1109/TED.2003.814982, ISSN : 0018-9383 (Print), 1557-9646 (Online)

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3

Influence of 4H-SiC Semi-insulating substrate purity on SiC Metal-Semiconductor Field-Effect Transistor Performance A. P. Zhang, L. B. Rowland, E. B. Kaminsky, J. B. Tucker, R. A. Beaupre, J. W. Kretchmer, J. L. Garrett, A. Vertiatchikh, G. Koley, H. Y. Cha, A. F. Allen, J. Cook, J. Foppes, B. J. Edward Journal of Electronic Materials, vol. 32, no. 05, pp.437-443, 2003. DOI : 10.1007/s11664-003-0174-3, ISSN : 0361-5235 (Print), 1543-186X (Online)

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2

Passivation effect on Channel Recessed 4H-SiC MESFETs Ho-Young Cha, C. I. Thomas, G. Koley, L. F. Eastman, and M. G. Spencer Materials Science Forum, vol. 433-436, pp.749-752, 2003. DOI : 10.4028/www.scientific.net/MSF.433-436.749, ISSN : 0255-5476 (Print), 1662-9752 (Online)

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1999

1

A study on 0.1 um scale T-gate process by using e-beam under-dose exposure Ho-Young Cha, Jea-Hak Lee, Youn-Kyu Chung, Ki-Woong Chung, and Kwang-Seok Seo Journal of Korean Physical Society, vol 35, pp.S1059-S1062, 1999. DOI : 10.3938/jkps.35.1059, ISSN : 0374-4884 (Print), 1976-8524 (Online)

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