Publication

Advanced Semiconductor Technology Laboratory

International journal
2012
52 Breakdown voltage enhancement in field plated AlGaN/GaN-on-Si HFETs using mesa-first prepassivation process B.-R. Park, J.-G. Lee, H.-J. Lee, J.Lim, K.-S. Seo, and H.-Y. Cha Electronics Letters, vol. 48, no. 3, pp. 181-192, 2012. DOI : 10.1049/el.2011.3778, ISSN : 0013-5194 (Print), 1350-911X (Online) LINK
2011
51 Field Plated AlGaN/GaN-on-Si HEMTs for High Voltage Switching Applications J.-G. Lee, H.-J. Lee, M. Lee, Y. Ryoo, J.-K. Mun, K.-S Seo, H.-Y. Cha Journal of the Korean Physical Society, vol. 59, no. 3, pp.2297-2300, 2011. DOI : 10.3938/jkps.59.2297, ISSN : 0374-4884 (Print), 1976-8524 (Online) LINK
50 Prepassivated AlGaN/GaN HEMTs with improved edge acuity in annealed ohmic contacts M. Lee, Y. Ryoo, J.-G. Lee, H.-Y. Cha, K. Seo Electronic Lett. vol. 47, pp.725-726, 2011. DOI : 10.1049/el.2011.1190, ISSN : 0013-5194 (Print), 1350-911X (Online) LINK
49 Effects of Field Plate and Buried Gate Structures on Silicon Carbide Metal-Semiconductor Field-Effect Transistors J.-G. Lee, C.-H. Cho and H.-Y. Cha IEICE Trans. Electronics, vol. E94-C, no. 5, pp.842-845, 2011. DOI : 10.1587/transele.E94.C.842, ISSN : 0916-8524 (Print), 1745-1353 (Online) LINK
48 Errors in Pi-Coefficients Due to the Strain Effects in Resistor Stress Sensor on (001) Silicon C.-H. Cho and H.-Y. Cha IEICE Trans. Electronics, vol. E94-C, no. 5, pp.791-795, 2011. DOI : 10.1587/transele.E94.C.791, ISSN : 0916-8524 (Print), 1745-1353 (Online) LINK
2010
47 Thermal instability of copper gate AlGaN/GaN HEMT on Si substrate J. Park, K. Lee, H.-Y. Cha and K. Seo Electronics Letters, vol. 46, no. 14, pp.1011-1012, 2010. DOI : 10.1049/el.2010.1485, ISSN : 0013-5194 (Print), 1350-911X (Online) LINK
46 DC Characteristics of Wide Bandgap Semiconductor Field Effect Transistors at Cryogenic Temperatures H. Kim, J. Lim and H.-Y. Cha, Journal of the Korean Physical Society, vol. 56, no. 5, pp.1523-1526, 2010. DOI : 10.3938/jkps.56.1523, ISSN : 0374-4884 (Print), 1976-8524 (Online) LINK
45 Structural optimization of silicon carbide PIN avalanche photodiodes for UV detection H.-Y. Cha Journal of the Korean Physical Society, vol. 56, no. 2, pp.672-676, 2010. DOI : 10.3938/jkps.56.672, ISSN : 0374-4884 (Print), 1976-8524 (Online) LINK
44 Strain effects in van der Pauw (VDP) stress sensor fabricated on (111) silicon C.-H. Cho, G. Choi and H.-Y. Cha IEICE Transactions on Electronics, vol. E93-C, no. 5, pp.640-643, 2010. DOI : 10.1587/transele.E93.C.640, ISSN : 0916-8524 (Print), 1745-1353 (Online) LINK
43 4H-SiC Avalanche Photodiodes for 280 nm UV Detection H.-Y. Cha, H.-K. Sung, H. Kim, C.-H. Cho and P. M. Sandvik IEICE Transactions on Electronics, vol. E93-C, no. 5, pp.648-650, 2010. DOI : 10.1587/transele.E93.C.648, ISSN : 0916-8524 (Print), 1745-1353 (Online) LINK
42 SiNx Prepassivation of AlGaN/GaN High-Electron-Mobility Transistors Using Remote-mode Plasma-Enhanced Chemical Vapor Depositions J.-C. Her, H.-J. Cho, H.-Y. Cha, J.-E. Oh, C.-S. Yoo and K.-S. Seo Japanese Journal of Applied Physics. Vol. 49, no. 4, p.041002, 2010. DOI : 10.1143/JJAP.49.041002, ISSN : 0021-4922 (Print), 1347-4065 (Online) LINK
41 Thermal consideration in LED array design for LCD backlight unit applications B.-R. Park and H.-Y. Cha IEICE Electronics Express, vol.7, no.1, pp.40-46, 2010. DOI : 10.1587/elex.7.40, ISSN : 1349-2543 (Online) LINK
2008
40 Avalanche multiplication and impact ionization in separate absorption and multiplication 4H-SiC avalanche photodiodes W. Loh, J.P.R. David, S.I. Soloviev, H.-Y. Cha, P. M. Sandvik, J.S. Ng and C.M. Johnson Mat. Sci. Forum, vol. 600-603, pp.1207-1210, 2008. DOI : 10.4028/www.scientific.net/MSF.600-603.1207, ISSN : 0255-5476 (Print), 1662-9752 (Online) LINK
39 Observation of luminescence from defects in 4H-SiC APDs operating in avalanche breakdown S. Soloviev, P. Sandvik, A. Vertiatchikh, K. Dovidenko and H. Cha Mat. Sci. Forum, vol. 600-603, pp.1211-1214, 2008. DOI : 10.4028/www.scientific.net/MSF.600-603.1211, ISSN : 0255-5476 (Print), 1662-9752 (Online) LINK
38 4H-SiC PIN recessed-window avalanche photodiode with high quantum efficiency H. Liu, D. Mcintosh, X. Bai, H. Pan, M. Liu, J. C. Campbell, H.-Y. Cha IEEE Photonics Technology Letters. vol. 20, no. 18, pp.1551-1553, 2008. DOI : 10.1109/LPT.2008.928823, ISSN : 1041-1135 (Print), 1941-0174 (Online) LINK

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  • IEEE

  • Hongik
    University

  • Alimni

  • Professor

School of Electronic and Electrical Engineering
Hongik University
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