Publication

Advanced Semiconductor Technology Laboratory

International journal
Analysis of Thermal Characteristics of AlGaN/GaN Heterostructure Field-Effect Transistors Using Micro-Raman Spectroscopy
Title Analysis of Thermal Characteristics of AlGaN/GaN Heterostructure Field-Effect Transistors Using Micro-Raman Spectroscopy
Info J.-S. Yoo, S.-K. Chang, G.-W. Jung, K.-H. Kim, T.-S. Kim, J.-H. Song, H.-Y. Cha and S.-W. Han
Name Journal of nanoscience and nanotechnology, vol. 21, no. 11, pp. 5736-5741(6), Nov., 2021.
Link 관련링크 https://www.ingentaconnect.com/content/asp/jnn/2021/00000021/00000011/… 428회 연결
Analysis of Thermal Characteristics of AlGaN/GaN Heterostructure Field-Effect Transistors Using Micro-Raman Spectroscopy