Publication

Advanced Semiconductor Technology Laboratory

International journal
Analysis of Hot Carrier Degradation in 0.25-um Schottky Gate AlGaN/GaN HEMTs
Title Analysis of Hot Carrier Degradation in 0.25-um Schottky Gate AlGaN/GaN HEMTs
Info S.-I. Cho, W.-H. Jang, H.-Y. Cha and H.-T. Kim
Name Journal of Electromagnetic Engineering and Science, Vol. 22, No. 3, pp. 291~295, May, 2022
Link 관련링크 http://www.jees.kr/journal/view.php?number=3509 855회 연결
Analysis of Hot Carrier Degradation in 0.25-um Schottky Gate AlGaN/GaN HEMTs

  • IEEE

  • Hongik
    University

  • Alimni

  • Professor

School of Electronic and Electrical Engineering
Hongik University
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