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Advanced Semiconductor Technology Laboratory

International journal
Abnormal Temperature and Bias Dependence of Threshold Voltage Instability in p-GaN/AlGaN/GaN HEMTs
Title Abnormal Temperature and Bias Dependence of Threshold Voltage Instability in p-GaN/AlGaN/GaN HEMTs
Info M. -S. Chae, H. -Y. Cha and H. Kim
Name IEEE Journal of the Electron Devices Society, Vol. 12, pp.581 - 586, Aug, 2024
Link 관련링크 https://ieeexplore.ieee.org/document/10620298 110회 연결
Abnormal Temperature and Bias Dependence of Threshold Voltage Instability in p-GaN/AlGaN/GaN HEMTs