Abnormal Temperature and Bias Dependence of Threshold Voltage Instability in p-GaN/AlGaN/GaN HEMTs | |
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Title | Abnormal Temperature and Bias Dependence of Threshold Voltage Instability in p-GaN/AlGaN/GaN HEMTs |
Info | M. -S. Chae, H. -Y. Cha and H. Kim |
Name | IEEE Journal of the Electron Devices Society, Vol. 12, pp.581 - 586, Aug, 2024 |
Link | https://ieeexplore.ieee.org/document/10620298 110회 연결 |