Publication

Advanced Semiconductor Technology Laboratory

International conference
2005
31 Ultraviolet GaN/AlGaN multiple-quantum well light-emitting d… International Conference on Nitride Semiconductors (ICNS-6), Bremen, Germany, Aug. 28 - Sep. 2, 2005. Chul Huh, Ho-Young Cha, William Schaff, and Lester F. Eastman
30 Gallium nitride based ballistic electron acceleration negati… Device Research Conference, Santa Barbara, CA, June 20-22, 2005. Ho-Young Cha, Xiaodong Chen, William J. Schaff, Michael G. Spencer, Lester F. Eastman, Brian K. Ridley, James Pomeroy, Martin Kuball
29 Excellent surface morphology and low contact resistivity of … Electronic Materials Conference, Santa Barbara, CA, June 22-24, 2005. Ho-Young Cha, X. Chen, H. Wu, Y.-J. Sun, W. J. Schaff, M. G. Spencer, L. F. Eastman
28 High yield GaN nanowire FET fabrication and characterization Electronic Materials Conference, Santa Barbara, CA, June 22-24, 2005. Huaqiang Wu, Ho-Young Cha, Mvr Chandrashekhar, Goutam Koley, Michael G. Spencer
27 A new approach to maximizing the power handling capability i… 36th IEEE Power Electronics Specialists Conference (PESC), Recife, Brazil, June 12-16, 2005. Y. C. Choi, H.-Y. Cha, M. Chandrashekhar, L. F. Eastman, and M. G. Spencer
26 GaN nanowire field effect transistor electrical characteriza… ChinaNano 2005(China International Conference on Nanoscience and Technology), Beijing, China, June 9-11, 2005. H. Q. Wu, H.-Y.Cha, M. Chandrashekhar, G. Koley, M. G. Spencer
25 Improved Performance of 4H-SiC MESFETs under Small Doses of … Workshop on Compound Semiconductor Devices and Integragted Circuits in Europe (WOCSDICE), Cardiff, UK, May 16-18, 2005. S. A. Vitusevich, M. V. Petrychuk, A. M. Kurakin, S. V. Danyluyk, A. E. Belyaev, H. -Y. Cha, M. G. Spencer, L. F. Eastman, N. Klein
24 Fabrication and Characteristics of Pre-aligned GaN Nanowire … Nanoscale Devices and System Integration 2005, Huston, TX, April 4-6, 2005. Ho-Young Cha, Huaqiang Wu, Mvr Chandrashekhar, Goutam Koley, Michael G. Spencer
2004
23 Ballistic Electron Acceleration Negative-Defferential-Conduc… Advanced Workshop on 'Frontiers in Electronics (WOFE), Palm Beach, Aruba, Dec. 18-22, 2004. (invited) Lester F. Eastman, William J. Schaff, Brian K. Ridley, Ho-Young Cha, Xiaoding Chen, and Michael G. Spencer
22 Investigation of Low Field Mobility Related Behaviour in SiC… European Conference of Silicon Carbide and Related Materials (ECSCRM), Bologna, Italy, Aug. 31 - Sep. 4, 2004. Ho-Young Cha, Y. Choi, L.F. Eastman, M.G. Spencer
21 Simulation study on breakdown behavior of field-plate SiC ME… IEEE Lester Eastman Conference on High Performance Devices, Troy, NY, Aug. 4-6, 2004. Ho-Young Cha, Y. C. Choi, L. F. Eastman, and M. G. Spencer
20 Influence of the n diffusion layer on the channel current an… IEEE Lester Eastman Conference on High Performance Devices, Troy, NY, Aug. 4-6, 2004. Y. C. Choi, H.-Y. Cha, L. F. Eastman, and M. G. Spencer
19 Kelvin probe measurements to study surface donor model in Al… International Workshop on Nitride Semiconductors, Pittsburgh, PA, July 19-23, 2004. Goutam Koley, Ho-Young Cha, Jeonghyun Hwang, William Schaff, Lester F. Eastman, and Michael G. Spencer
18 Influence of low field mobility related issues on SiC MESFET… Electronic Materials Conference (EMC), Notre Dame, IN, June 23-25, 2004. Ho-Young Cha, Y. Choi, L.F. Eastman, M.G. Spencer, L. Ardaravicius, A. Matulionis,and O. Kiprijanovic
17 The effects of surface passivation treatments on large signa… Spring MRS Conference, San Francisco, April 12-16, 2004. Ho-Young Cha, Y. C. Choi, Lester F. Eastman, A. O. Konstantinov, C. I. Harris, P. Ericsson, M. G. Spencer

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