Publication

Advanced Semiconductor Technology Laboratory

International conference
2012
66 Enhancement of RF Characteristics of AlGaN/GaN HEMTs with Sh… International Conference on Solid State Devices and Materials(SSDM), Kyoto, Japan, September 25-27, 2012. M. Lee, Y. M. Ryoo, N. Lee, H.-Y. Cha and K.-S. Seo LINK
65 Normally-Off Recessed AlGaN/GaN MOSHFETs Using ICPCVD SiO2 International Conference on Solid State Devices and Materials(SSDM), Kyoto, Japan, September 25-27, 2012. B.-R. Park, J.-G. Lee, I. H. Min, K.-S. Seo and H.-Y. Cha LINK
64 Reverse Gate Bias Stress on high-voltage AlGaN/GaN-on-Si Het… International Conference on Solid State Devices and Materials(SSDM), Kyoto, Japan, September 25-27, 2012. S. Choi, J.-G. Lee, H. Yoon, H.-Y Cha and H. Kim LINK
63 Enhancement mode AlGaN/GaN MIS-HEMTs using optimized Si3N4 g… International Conference on Solid State Devices and Materials(SSDM), Kyoto, Japan, September 25-27, 2012. W. Choi, H. Ahn, N. Jeon, I. Min, H.-Y. Cha and K.-S. Seo LINK
62 Power Schottky Barrier Diodes with Improved Schottky Contact… International Conference on Solid State Devices and Materials(SSDM), Kyoto, Japan, September 25-27, 2012. N. Jeon, W. Choi, I. Min, H.-Y. Cha and K.-S. Seo LINK
61 Improved Electrical Characteristics of AlGaN/GaN HEMT with I… International Conference on Solid State Devices and Materials(SSDM), Kyoto, Japan, September 25-27, 2012. M. Lee, Y. M. Ryoo, N. Lee, H.-Y. Cha and K.-S. Seo LINK
60 Degradation Characteristics of High-Voltage AlGaN/GaN-on-Si … IEEE Compound Semiconductor Integrated Circuit Symposium(CSICS), La Jolla, USA, October 14-17, 2012. S. Choi, J.-G. Lee, H. Yoon, H.-Y. Cha, and H. Kim
59 ICPCVD SiO2 for AlGaN/GaN MISHFET application Asia-Pacific Workshop on Fundamentals and Applications of Advanced Semiconductor Devices(AWAD), Naha, Japan, June 27-29, 2012. B.-R. Park, J.-G. Lee, H. kim, and H.-Y. Cha LINK
58 Degradation Characteristics of high voltage AlGaN/GaN-on-Si … Asia-Pacific Workshop on Fundamentals and Applications of Advanced Semiconductor Devices(AWAD), Naha, Japan, June 27-29, 2012. S. Choi, H. Yoon, D. Keum, J.-G. Lee, H.-Y. Cha and H. Kim LINK
57 Stress Measurement Errors induced by the Strain Effects in R… Asia-Pacific Workshop on Fundamentals and Applications of Advanced Semiconductor Devices(AWAD), Naha, Japan, June 27-29, 2012. C.-H. Cho and H.-Y. Cha LINK
56 High Breakdown Voltage (1590V) AlGaN/GaN-on-Si HFETs with Op… CS MANTECH conference, Boston, USA, April 23-26, 2012. J.-G. Lee, B.-R. Park, H.-J. Lee, M. Lee, H. An, K.-S. Seo and H.-Y. Cha LINK
2011
55 Study on high breakdown voltage AlGaN/GaN-on-Si HEMTs with g… Asia-Pacific Workshop on Fundamentals and Applications of Advanced Semiconductor Devices(AWAD), Daejeon, Korea, June 29-July 1, 2011. H.-J. Lee, J.-G. Lee, C.-H. Cho, H.-Y. Cha
54 Improvement of adhesion B/W BCB and GaN for post-process of … Asia-Pacific Workshop on Fundamentals and Applications of Advanced Semiconductor Devices(AWAD), Daejeon, Korea, June 29-July 1, 2011. Y. Ryoo, M. Lee, J.-G. Lee, H.-Y. Cha, K.-S. Seo
53 The effects of crystallographic misalignment in application … Asia-Pacific Workshop on Fundamentals and Applications of Advanced Semiconductor Devices(AWAD), Daejeon, Korea, June 29-July 1, 2011. C.-H. Cho and H.-Y. Cha
52 Prepassivated AlGaN/GaN HEMTs with improved edge acuity in a… Asia-Pacific Workshop on Widegap Semiconductors, Toba, Japan, May.22-26, 2011. M. Lee, Y. Ryoo, J.-G. Lee, H.-Y. Cha, K.-S. Seo

검색

  • IEEE

  • Hongik
    University

  • Alimni

  • Professor

School of Electronic and Electrical Engineering
Hongik University
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