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Publication

Advanced Semiconductor Technology Laboratory

International conference

2004

7

Ballistic Electron Acceleration Negative-Defferential-Conduc… Advanced Workshop on 'Frontiers in Electronics (WOFE), Palm Beach, Aruba, Dec. 18-22, 2004. (invited) Lester F. Eastman, William J. Schaff, Brian K. Ridley, Ho-Young Cha, Xiaoding Chen, and Michael G. Spencer

6

Investigation of Low Field Mobility Related Behaviour in SiC… European Conference of Silicon Carbide and Related Materials (ECSCRM), Bologna, Italy, Aug. 31 - Sep. 4, 2004. Ho-Young Cha, Y. Choi, L.F. Eastman, M.G. Spencer

5

Simulation study on breakdown behavior of field-plate SiC ME… IEEE Lester Eastman Conference on High Performance Devices, Troy, NY, Aug. 4-6, 2004. Ho-Young Cha, Y. C. Choi, L. F. Eastman, and M. G. Spencer

4

Influence of the n diffusion layer on the channel current an… IEEE Lester Eastman Conference on High Performance Devices, Troy, NY, Aug. 4-6, 2004. Y. C. Choi, H.-Y. Cha, L. F. Eastman, and M. G. Spencer

3

Kelvin probe measurements to study surface donor model in Al… International Workshop on Nitride Semiconductors, Pittsburgh, PA, July 19-23, 2004. Goutam Koley, Ho-Young Cha, Jeonghyun Hwang, William Schaff, Lester F. Eastman, and Michael G. Spencer

2

Influence of low field mobility related issues on SiC MESFET… Electronic Materials Conference (EMC), Notre Dame, IN, June 23-25, 2004. Ho-Young Cha, Y. Choi, L.F. Eastman, M.G. Spencer, L. Ardaravicius, A. Matulionis,and O. Kiprijanovic

1

The effects of surface passivation treatments on large signa… Spring MRS Conference, San Francisco, April 12-16, 2004. Ho-Young Cha, Y. C. Choi, Lester F. Eastman, A. O. Konstantinov, C. I. Harris, P. Ericsson, M. G. Spencer

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