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High gate stress stability of P-GaN/p-AlGaN/AlGaN/GaN HFET
Title	High gate stress stability of P-GaN/p-AlGaN/AlGaN/GaN HFET
Info1	J-H Yim, D-G Kim, M-G Lee, Hyungtak Kim, H-Y Cha
Info2	12th International Workshop on Nitride Semiconductors O'ahu, Hawai'i, November 3–8, 2024
Link	https://www.iwn2024.org/program/program-schedule 20회 연결
[Poster 185] High gate stress stability of P-GaN/p-AlGaN/AlGaN/GaN HFET Jun-Hyeok Yim1, Dong-Guk Kim2, Min-Geun Lee1, Hyungtak Kim1, Ho-Young Cha1 Hong-Ik University, Seoul, Korea, Republic of. 2ChipsK, Anyang, Korea, Republic of