Publication

Advanced Semiconductor Technology Laboratory

Domestic conference
Development of Fluorine-based Low Damage Selective Etching Process for p-GaN/AlGaN/GaN HFET Fabrication
Title Development of Fluorine-based Low Damage Selective Etching Process for p-GaN/AlGaN/GaN HFET Fabrication
Info1 H.-J. Kim, J.-H. Yim, and H.-Y. Cha
Info2 2023년 반도체공학회 하계학술대회, The Institute of Semiconductor Engineers, Gyeongju Jul 17-19 2023
Link 관련링크 https://event.theise.org/conference/ 75회 연결
Development of Fluorine-based Low Damage Selective Etching Process for p-GaN/AlGaN/GaN HFET Fabrication